JEOL JSM 5610 scanning electron microscope with an add-on

JEOL JSM 5610 Scanning Electron Microscope with Oxford INCA Energy-Dispersive X-ray Spectrometer

The JEOL JSM 5610 is a high-performance scanning electron microscope (SEM) that provides the capability to analyze fine features in a wide range of materials. Paired with the Oxford INCA energy-dispersive X-ray spectrometer, this microscope allows for precise mapping and elemental analysis.

The energy-dispersive X-ray spectroscopy (EDS/EDX) technique enables detailed elemental and chemical analysis of samples, offering valuable insights into the composition of materials under study.

Although this microscope has not received service from JEOL for six years, the accessories remain in good condition. Both computers for the SEM and EDS, along with the software, are functional. The vacuum pump is operational, but it is worth noting that the chiller is missing. To improve image quality, the EDX component requires calibration for accurate results.